Translator Disclaimer
25 February 2010 Four-focus single-particle position determination in a confocal microscope
Author Affiliations +
We discuss the capabilities for sub-diffraction, single-nanoparticle position determination in a confocal one- or twophoton microscope with four-focus pulse-interleaved excitation and time-gated single-photon counting. As the technique is scalable to multiple detectors for multi-color observations, it can be used to find the separations of differently colored molecules over a distance range that is complementary to that achievable by FRET. Also, there is a possibility for improved spatial localization by using the nonlinearity of saturation of the excitation or by using the technique together with imaging of the point spread function. Applications of two experimental set-ups for four-focus fluorescence excitation for studies of quantum dots and single-particle manipulation and trapping are also discussed.
© (2010) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Lloyd M. Davis, Brian K. Canfield, James A. Germann, Jason K. King, William N. Robinson, Albert D. Dukes III, Sandra J. Rosenthal, Philip C. Samson, and John P. Wikswo "Four-focus single-particle position determination in a confocal microscope", Proc. SPIE 7571, Single Molecule Spectroscopy and Imaging III, 757112 (25 February 2010);


Back to Top