Paper
17 February 2010 Reliable pulsed-operation of 1064-nm wavelength-stabilized diode lasers at high-average-power: boosting fiber lasers from the seed
M. Bettiati, G. Beuchet, P. Pagnod-Rossiaux, P. Garabedian, J. Perinet, S. Fromy, J. Bertreux, J. Hirtz, F. Laruelle
Author Affiliations +
Abstract
Most Pulsed Fiber Lasers (FLs) are built on a Master Oscillator - Power Amplifier (MOPA) architecture, as this configuration has the advantage, among others, of exploiting direct modulation of the diode laser seed (the MO) to reach high repetition rates and high peak-power pulsed operation. To enhance the FL global performance and reliability, high power single-lateral-mode 1064 nm diodes with outstanding long-term behavior are needed. The reliability of these devices at high power has been a challenge for years, due to the high built-in strain in the Quantum Well (QW). In this paper, we present excellent reliability results obtained, in both cw and pulsed conditions, on the latest generation of 1064 nm single-lateral-mode diodes developed at 3S PHOTONICS. Aging tests in cw conditions prove the intrinsic robustness of the diode even at very high junction temperatures, while specific tests in pulsed operation at 45 °C heat-sink temperature, and high repetition rates of several hundred kHz, confirm the stability of the devices in accelerated conditions directly derived from real applications. Both free-running and wavelength stabilized (by means of a Fiber Bragg Grating (FBG)) packaged devices show very stable performances under pulsed conditions. Reliable operation at higher average power than currently commercially available diode lasers seeds is demonstrated.
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M. Bettiati, G. Beuchet, P. Pagnod-Rossiaux, P. Garabedian, J. Perinet, S. Fromy, J. Bertreux, J. Hirtz, and F. Laruelle "Reliable pulsed-operation of 1064-nm wavelength-stabilized diode lasers at high-average-power: boosting fiber lasers from the seed", Proc. SPIE 7580, Fiber Lasers VII: Technology, Systems, and Applications, 758025 (17 February 2010); https://doi.org/10.1117/12.840896
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KEYWORDS
Diodes

Semiconductor lasers

Fiber Bragg gratings

Reliability

Pulsed laser operation

Fiber lasers

Quantum wells

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