Paper
22 January 2010 Defect states in type-II strained-layer superlattices
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Abstract
The electronic structure of isoelectronic defects, donors and acceptors is calculated within a full superlattice picture for InAs/GaSb and InAs/GaInSb superlattices. The wavefunctions associated with these states extend beyond a typical layer width for the superlattices. Thus band alignments between the layers as well as interface properties are predicted to dramatically change these defects' binding energy as well as their influence on superlattice electronic, optical and transport properties. Defect properties are also substantially modified by their location within a superlattice layer.
© (2010) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Michael E. Flatté and Craig E. Pryor "Defect states in type-II strained-layer superlattices", Proc. SPIE 7608, Quantum Sensing and Nanophotonic Devices VII, 760824 (22 January 2010); https://doi.org/10.1117/12.846915
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CITATIONS
Cited by 6 scholarly publications.
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KEYWORDS
Superlattices

Indium arsenide

Gallium antimonide

Sensors

Scanning tunneling microscopy

Doping

Long wavelength infrared

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