Paper
29 March 2010 Dynamics of radical cation of poly(4-hydroxystyrene) generated in thin film upon exposure to electron beam
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Abstract
In chemically amplified resists for extreme ultraviolet (EUV) and electron beam (EB) lithographies, the reaction mechanism of acid generation is different from that for photolithography. However, details of acid generation are still unclear. In particularly, details of the deprotonation dynamics of radical cations in solid resist films have not been investigated. The dynamics of radical cations of resist polymer is important for understanding proton generation. Poly(4-hydroxystyrene) (PHS) is a typical polymer for EUV and EB lithographies. We observed the dynamics of PHS radical cation in PHS film by using pulse radiolysis.
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Kenichiro Natsuda, Takahiro Kozawa, Kazumasa Okamoto, Akinori Saeki, and Seiichi Tagawa "Dynamics of radical cation of poly(4-hydroxystyrene) generated in thin film upon exposure to electron beam", Proc. SPIE 7639, Advances in Resist Materials and Processing Technology XXVII, 76391K (29 March 2010); https://doi.org/10.1117/12.846699
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Cited by 4 scholarly publications.
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KEYWORDS
Absorption

Solids

Electron beams

Polymers

Absorbance

Chromium

Extreme ultraviolet lithography

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