Paper
30 March 2010 Development of molecular resists based on Phenyl[4]calixarene derivatives.
Masatoshi Echigo, Hiromi Hayashi, Hiroaki Oizumi, Kazuyuki Matsumaro, Toshiro Itani
Author Affiliations +
Abstract
We have developed negative-tone molecular resist based on C-4-cyclohexylphenylcalix[4]resorcinarene(MGR108) and positive-tone molecular resist based on protected C-4-isopropylphenylcalix[4]resorcinarene (MGR104P). Both MGR108 and MGR104P showed high solubility in both conventional resist solvents such as propylene glycol monomethyl ether and conventional alkaline developer of 0.26N TMAHaq. In this paper, we show current performance of resists by EB lithography (EBL) and EUV lithography (EUVL).
© (2010) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Masatoshi Echigo, Hiromi Hayashi, Hiroaki Oizumi, Kazuyuki Matsumaro, and Toshiro Itani "Development of molecular resists based on Phenyl[4]calixarene derivatives.", Proc. SPIE 7639, Advances in Resist Materials and Processing Technology XXVII, 76392B (30 March 2010); https://doi.org/10.1117/12.846475
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Cited by 4 scholarly publications and 1 patent.
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KEYWORDS
Extreme ultraviolet lithography

Optical lithography

Cadmium sulfide

Line edge roughness

Industrial chemicals

Standards development

Lithography

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