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30 March 2010 Measuring SWNT depth in electroactive polymer nanocomposite films using electric force microscopy
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Abstract
Although a number of hypotheses have been presented to explain the enhanced electromechanical performance observed in electroactive polymer nanocomposite materials, many of the underlying mechanisms responsible for this behavior remain unclear. In this report, electric force microscopy (EFM) is used to investigate the near surface morphology of an electroactive polyimide-based nanocomposite film containing SWNTs in an effort to gain insight into the electrical interactions occurring at the polymer-electrode interface. As a means of measuring the proximity of SWNTs to this interface, the depths of SWNTs buried beneath a processing-induced polymer skin layer are determined using EFM measurements derived from a sample standard. In this way, evaluation of the ability for embedded SWNT structures to behave as extensions of surface electrodes is possible, a scenario that could potentially reduce the applied field required to elicit electromechanical actuation.
© (2010) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Aaron T. Sellinger, Sujay Deshmukh, Zoubeida Ounaies, Sang Nyon Kim, and Richard A. Vaia "Measuring SWNT depth in electroactive polymer nanocomposite films using electric force microscopy", Proc. SPIE 7644, Behavior and Mechanics of Multifunctional Materials and Composites 2010, 76441I (30 March 2010); https://doi.org/10.1117/12.851913
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