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31 March 2010Estimation of fatigue life using electromechanical impedance technique
Fatigue induced damage is often progressive and gradual in nature. Structures subjected to large
number of fatigue load cycles will encounter the process of progressive crack initiation, propagation
and finally fracture. Monitoring of structural health, especially for the critical components, is therefore
essential for early detection of potential harmful crack.
Recent advent of smart materials such as piezo-impedance transducer adopting the
electromechanical impedance (EMI) technique and wave propagation technique are well proven to be
effective in incipient damage detection and characterization. Exceptional advantages such as
autonomous, real-time and online, remote monitoring may provide a cost-effective alternative to the
conventional structural health monitoring (SHM) techniques.
In this study, the main focus is to investigate the feasibility of characterizing a propagating fatigue
crack in a structure using the EMI technique as well as estimating its remaining fatigue life using the
linear elastic fracture mechanics (LEFM) approach. Uniaxial cyclic tensile load is applied on a
lab-sized aluminum beam up to failure. Progressive shift in admittance signatures measured by the
piezo-impedance transducer (PZT patch) corresponding to increase of loading cycles reflects
effectiveness of the EMI technique in tracing the process of fatigue damage progression. With the use
of LEFM, prediction of the remaining life of the structure at different cycles of loading is possible.
Yee Yan Lim andChee Kiong Soh
"Estimation of fatigue life using electromechanical impedance technique", Proc. SPIE 7647, Sensors and Smart Structures Technologies for Civil, Mechanical, and Aerospace Systems 2010, 764722 (31 March 2010); https://doi.org/10.1117/12.846902
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Yee Yan Lim, Chee Kiong Soh, "Estimation of fatigue life using electromechanical impedance technique," Proc. SPIE 7647, Sensors and Smart Structures Technologies for Civil, Mechanical, and Aerospace Systems 2010, 764722 (31 March 2010); https://doi.org/10.1117/12.846902