FBG array demodulation based on optical wavelet filtering

Shiqing Qi; Zhaoxia Wu; Chen Wang; Zhi Kong

doi:10.1117/12.867959

11 October 2010 FBG array demodulation based on optical wavelet filtering

Shiqing Qi, Zhaoxia Wu, Chen Wang, Zhi Kong

Proceedings Volume 7656, 5th International Symposium on Advanced Optical Manufacturing and Testing Technologies: Optical Test and Measurement Technology and Equipment; 765631 (2010) https://doi.org/10.1117/12.867959
Event: 5th International Symposium on Advanced Optical Manufacturing and Testing Technologies, 2010, Dalian, China

Abstract

This paper proposes a measurement system of vibration acceleration with wavelength division multiplexing and continuous wave tunable frequency. The optical wavelet filter is designed to improve imbalanced and nonlinear optical signal efficiently. So the optical wavelength coded absolutely is completed. Using the electrically-programmable space modulator can filter and select frequency quickly. Besides, the signals of variation voltage produced by the computers' filtering and selecting frequency spectrum signals implement the wavelet transform. At the same time, voltage signals are controlled by the computer's filtering and selecting frequency spectrum signals. In the experiment, according to the frequency spectrum characteristics of the measuring signals, the Morlet wavelet is regarded as the mother one. The center wavelength of the wavelet function variation is controlled by computers. What's more, selecting the wavelet transform parameter values appropriately can control the transmission spectrum of wavelet bandwidth. Then the use of optical wavelet filters can achieve a center wavelength of FBG demodulation. Above all, this modulation method has more advantages such as simple structure, high scanning frequency, high resolution and good linearity over the common scanning filter.

Citation Download Citation

Shiqing Qi, Zhaoxia Wu, Chen Wang, and Zhi Kong "FBG array demodulation based on optical wavelet filtering", Proc. SPIE 7656, 5th International Symposium on Advanced Optical Manufacturing and Testing Technologies: Optical Test and Measurement Technology and Equipment, 765631 (11 October 2010); https://doi.org/10.1117/12.867959

ACCESS THE FULL ARTICLE

INSTITUTIONAL
Select your institution to access the SPIE Digital Library.

SELECT YOUR INSTITUTION

PERSONAL
Sign in with your SPIE account to access your personal subscriptions or to use specific features such as save to my library, sign up for alerts, save searches, etc.

PERSONAL SIGN IN

No SPIE Account? Create one

PURCHASE THIS CONTENT

SUBSCRIBE TO DIGITAL LIBRARY

50 downloads per 1-year subscription

Members: $195

Non-members: $335 ADD TO CART

25 downloads per 1 - year subscription

Members: $145

Non-members: $250 ADD TO CART

PURCHASE SINGLE ARTICLE

Includes PDF, HTML & Video, when available