The impact of manufacturing errors of domain structure on frequency doubling efficiency in PPLN waveguides

Zhengying Liu; Aihong Ren; Rongzhu Zhang; Jinglun Liu; Nianchun Sun; Jianguo Chen

doi:10.1117/12.865718

22 October 2010 The impact of manufacturing errors of domain structure on frequency doubling efficiency in PPLN waveguides

Zhengying Liu, Aihong Ren, Rongzhu Zhang, Jinglun Liu, Nianchun Sun, Jianguo Chen

Author Affiliations +

Proceedings Volume 7657, 5th International Symposium on Advanced Optical Manufacturing and Testing Technologies: Design, Manufacturing, and Testing of Micro- and Nano-Optical Devices and Systems; 76570W (2010) https://doi.org/10.1117/12.865718
Event: 5th International Symposium on Advanced Optical Manufacturing and Testing Technologies, 2010, Dalian, China

Abstract

While the length of polarization period in the periodically poled (PP) waveguides has manufacturing errors (MEs), the impact of this errors on Quasi-Phase-Macthed (QPM) frequency doubling efficiency (FDE), and that of polarization period Λ0 and length of the waveguides at the direction of transmission beams on ME tolerance, which are all theoretically analyzed. The results show that with the ME increasing, FDE decreases rapidly. And the ME tolerance of PP waveguides is inversely proportional to the length of waveguides and is directly proportional to the polarization period Λ₀. These results provide a theoretical basis for choosing material of periodically poled crystal (PPC) and controlling MEs.

Citation Download Citation

Zhengying Liu, Aihong Ren, Rongzhu Zhang, Jinglun Liu, Nianchun Sun, and Jianguo Chen "The impact of manufacturing errors of domain structure on frequency doubling efficiency in PPLN waveguides", Proc. SPIE 7657, 5th International Symposium on Advanced Optical Manufacturing and Testing Technologies: Design, Manufacturing, and Testing of Micro- and Nano-Optical Devices and Systems, 76570W (22 October 2010); https://doi.org/10.1117/12.865718

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