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28 October 2010 Nano-optical microscopy: now and its industrialization
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It is a review about the industrialization of Nano-Optical Microscope (NOM, also referred to as the Near-field Optical Microscope). Two comparisons of AF/PSTM (Transmission Mode) with the first generation commercial A-SNOM and AF/RNOM(Reflective Mode) with A-RNOM have discussed. The commercially used A-SNOM can only obtain a transmissivity image of A-SNOM-T(x,y), but AF/PSTM can obtain the separating the transmissivity image PSTM-T(x,y) and the refractive index imge PSTM-n1(x,y). AF/RNOM can obtain the lower contrast reflective index image but ARNOM cannot. The reason how could Pohl have obtained the first A-SNOM image with a resolution of 20-25nm in 1984 but the commercial A-SNOM-T(x,y) only with the resolution in the 50~100nm range is also discussed. Conclusion on the proposal of AF/PSTM and combined AF/RNOM may be the best candidate for the second generation commercial use of NOM.
© (2010) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Shifa Wu, Zhao Wang, Jian Zhang, Chenbiao Xu, Hong Li, and Shi Pan "Nano-optical microscopy: now and its industrialization", Proc. SPIE 7658, 5th International Symposium on Advanced Optical Manufacturing and Testing Technologies: Optoelectronic Materials and Devices for Detector, Imager, Display, and Energy Conversion Technology, 76580O (28 October 2010);

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