Threat assessment of aerial target in ultra-wide field of view infrared image

Yulong Zhou; Mingqiang Xing; Yongzhong Wang

doi:10.1117/12.865786

22 October 2010 Threat assessment of aerial target in ultra-wide field of view infrared image

Yulong Zhou, Mingqiang Xing, Yongzhong Wang

Proceedings Volume 7658, 5th International Symposium on Advanced Optical Manufacturing and Testing Technologies: Optoelectronic Materials and Devices for Detector, Imager, Display, and Energy Conversion Technology; 76582L (2010) https://doi.org/10.1117/12.865786
Event: 5th International Symposium on Advanced Optical Manufacturing and Testing Technologies, 2010, Dalian, China

Abstract

When the target is several miles away from the ultra-wide field of view (UWFV) infrared warning system, it will be a point target in the infrared image, so there is no the target information of distance, geometry and texture without which it is hard to assess the threat of target accurately. It is very important for the air defense command and decision making to have a correct threat assessment of the aerial target, and at present there are few reports about the aerial target threat assessment of the UWFV infrared warning system. The characteristic of the UWFV infrared image is analyzed. A laser range finder is used to measure the initial distance of each target which will be sent back to the infrared warning system. Together with the target information of initial distance, gray value, course angle and angular altitude, considering the nonlinear characteristic of aerial target threat assessment, the threat assessment method based on RBF neural network is presented for its good self-adaptive and self study ability to solve nonlinear complex problems. After simulation experiment, it is found that this method is available and effective.

Citation Download Citation

Yulong Zhou, Mingqiang Xing, and Yongzhong Wang "Threat assessment of aerial target in ultra-wide field of view infrared image", Proc. SPIE 7658, 5th International Symposium on Advanced Optical Manufacturing and Testing Technologies: Optoelectronic Materials and Devices for Detector, Imager, Display, and Energy Conversion Technology, 76582L (22 October 2010); https://doi.org/10.1117/12.865786

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KEYWORDS

Infrared radiation

Infrared imaging

Missiles

Neural networks

Target detection

Distance measurement

Image analysis

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