Paper
3 May 2010 Fabrication of wavelength selective germanium dielectric supported microbolometers
Author Affiliations +
Abstract
This paper describes the microfabrication process and characterization of wavelength selective germanium dielectric supported microbolometers, which should be compatible with standard microbolometer fabrication processes. Here we have demonstrated a micro fabricated robust germanium dielectric structure layer that replaces the usual silicon nitride structural layer in microbolometers. The fabricated microbolometers consist of a chromium resistive sheet as an absorber layer above an air-gap/germanium dielectric structure.
© (2010) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Jong Yeon Park, Joo-Yun Jung, Dean P. Neikirk, Aniruddha S. Weling, William T. Hafer, James H. Goldie, and Paul Wilson "Fabrication of wavelength selective germanium dielectric supported microbolometers", Proc. SPIE 7660, Infrared Technology and Applications XXXVI, 76601C (3 May 2010); https://doi.org/10.1117/12.850456
Advertisement
Advertisement
RIGHTS & PERMISSIONS
Get copyright permission  Get copyright permission on Copyright Marketplace
KEYWORDS
Germanium

Dielectrics

Microbolometers

FT-IR spectroscopy

Oxygen

Decision support systems

Plasma

Back to Top