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3 May 2010 Low IR input flux condition operations thanks to MCT e-APD
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Abstract
Low IR input flux conditions are answering different system applications as gas detection needs, active imagery, very long ranges detection and identification and some scientific applications. Then for other applications like ground applications, some system design trade-off could be made between thermal performance and identification and equipment size and cost.
© (2010) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Frédéric Pistone, Philippe Tribolet, Gilbert Decaens, Sebastien Verdet, Johan Rothman, and Eric De Borniol "Low IR input flux condition operations thanks to MCT e-APD", Proc. SPIE 7660, Infrared Technology and Applications XXXVI, 76603B (3 May 2010); https://doi.org/10.1117/12.850232
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