Fast and precise point spread function measurements of IR optics at extreme temperatures based on reversed imaging conditions

Volker Melzer; Hans-Georg Heckmann; Christian Ritter; Joachim Barenz; Michael Raab

doi:10.1117/12.850194

22 April 2010 Fast and precise point spread function measurements of IR optics at extreme temperatures based on reversed imaging conditions

Volker Melzer, Hans-Georg Heckmann, Christian Ritter, Joachim Barenz, Michael Raab

Author Affiliations +

Proceedings Volume 7662, Infrared Imaging Systems: Design, Analysis, Modeling, and Testing XXI; 766213 (2010) https://doi.org/10.1117/12.850194
Event: SPIE Defense, Security, and Sensing, 2010, Orlando, Florida, United States

Abstract

Point Spread Function (PSF), Modulation Transfer Function (MTF) and Ensquared Energy (EE) are important performance indicators of optical systems for surveillance, imaging and target tracking applications. We report on the development of a new measurement method which facilitates fast real time measurement of the two dimensional PSF and related performance parameters of a MWIR optical module under room temperature as well as under extreme temperature conditions. Our new measurement setup uses the law of reversibility of optical paths to capture a highly resolved, magnified image of the PSF. By using of an easy add-on thermally insulating enclosure the optical module can be exposed to and measured under both variable high and low temperatures (-50°C up to 90°C) without any external impact on the measurement. Also line of sight and various off-axis measurements are possible. Common PSF and MTF measurement methods need much more correction algorithms, whilst our method requires mainly a pinhole diameter correction only and allows fast measurements of optical parameters under temperature as well as fast and easy adjustment. Additionally comparison of the captured, highly resolved PSF with optical design data enables purposeful theoretical investigation of occurring optical artifacts.

Citation Download Citation

Volker Melzer, Hans-Georg Heckmann, Christian Ritter, Joachim Barenz, and Michael Raab "Fast and precise point spread function measurements of IR optics at extreme temperatures based on reversed imaging conditions", Proc. SPIE 7662, Infrared Imaging Systems: Design, Analysis, Modeling, and Testing XXI, 766213 (22 April 2010); https://doi.org/10.1117/12.850194

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