Improved Raman sensitivity using polarization analysis

Steven Christesen

doi:10.1117/12.851007

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5 May 2010 Improved Raman sensitivity using polarization analysis

Steven Christesen

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Proceedings Volume 7665, Chemical, Biological, Radiological, Nuclear, and Explosives (CBRNE) Sensing XI; 76651B (2010) https://doi.org/10.1117/12.851007
Event: SPIE Defense, Security, and Sensing, 2010, Orlando, Florida, United States

Abstract

Raman spectroscopy is a very powerful technique for molecular identification, and small Raman instruments have been used successfully to identify toxic substances. The sensitivity of the technique, however, can be limited by fluorescence interference arising from the analyte itself or sample impurities. In the case of surface detection, the Raman signature and/or fluorescence from the surface can also interfere with identification of the target chemical. We take advantage of the polarization characteristics of the Raman scattering to reduce the broadband fluorescence background and surface Raman features. Using a custom fiber optic probe with excitation at 785 nm, we have demonstrated real-time polarization analysis. The spectrum obtained by ratioing the parallel and perpendicular polarization components of the Raman scattering, reduces the surface signature and has a better spectral correlation to the target analyte.

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Steven Christesen "Improved Raman sensitivity using polarization analysis", Proc. SPIE 7665, Chemical, Biological, Radiological, Nuclear, and Explosives (CBRNE) Sensing XI, 76651B (5 May 2010); https://doi.org/10.1117/12.851007

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