Migrating from superconducting to semiconducting YBCO thin film bolometers as future far-infrared imaging pixels

Vishal S. Jagtap; Mattia Longhin; Mukesh K. Kulsreshath; Alain J. Kreisler; Annick F. Dégardin

doi:10.1117/12.850161

26 April 2010 Migrating from superconducting to semiconducting YBCO thin film bolometers as future far-infrared imaging pixels

Vishal S. Jagtap, Mattia Longhin, Mukesh K. Kulsreshath, Alain J. Kreisler, Annick F. Dégardin

Author Affiliations +

Proceedings Volume 7671, Terahertz Physics, Devices, and Systems IV: Advanced Applications in Industry and Defense; 76710X (2010) https://doi.org/10.1117/12.850161
Event: SPIE Defense, Security, and Sensing, 2010, Orlando, Florida, United States

Abstract

YBa₂Cu₃O_6+x compounds are well known to exhibit superconducting properties for x > 0.5 and semiconducting properties for lower oxygen content. Superconducting YBCO was obtained commercially; the semiconducting material was deposited by sputtering at room temperature. In order to migrate from superconducting to uncooled semiconducting far-infrared bolometer technologies, we have first realized and compared the performance of 2 × 2 pixel arrays made from both materials deposited on MgO substrates. Pixels were in the shape of meanders, embedded in an area of about 1 mm². Pixel detectivity and thermal crosstalk were studied in the 1 Hz to 100 kHz modulation frequency range by using a 850 nm solid state laser. Secondly we have improved the geometry of semiconducting YBCO bolometers fabricated on silicon substrates, in order to match their impedance with the impedance of the antenna required for working in the THz range. First optical results are also presented, where both regular bolometric and pyroelectric responses are exhibited.

Citation Download Citation

Vishal S. Jagtap, Mattia Longhin, Mukesh K. Kulsreshath, Alain J. Kreisler, and Annick F. Dégardin "Migrating from superconducting to semiconducting YBCO thin film bolometers as future far-infrared imaging pixels", Proc. SPIE 7671, Terahertz Physics, Devices, and Systems IV: Advanced Applications in Industry and Defense, 76710X (26 April 2010); https://doi.org/10.1117/12.850161

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