A sensitivity analysis of frequency selective surface based metamaterial at THz frequency

S. Islam; J. Stiens; R. Vounckx

doi:10.1117/12.854062

29 April 2010 A sensitivity analysis of frequency selective surface based metamaterial at THz frequency

S. Islam, J. Stiens, R. Vounckx

Proceedings Volume 7711, Metamaterials V; 77110L (2010) https://doi.org/10.1117/12.854062
Event: SPIE Photonics Europe, 2010, Brussels, Belgium

Abstract

This work presents a sensitivity analysis for the resonance frequency and bandwidth of dielectric supported Split Ring Resonator (SRR) metmaterial in THz frequency. The different designed parameters have been considered and their parametric sensitivities on resonance frequency and on bandwidth have been analyzed. The finite integral technique is used to simulate the structure and the numerical techniques are used to obtain the resonance frequency and bandwidth sensitivities as a function of the designed parameters. The analysis for sensitivity of the scattering parameters of metamaterial is especially very important in THz frequency range. The resonance frequency and the bandwidth are the main characteristics of a resonator Frequency Selective Surface (FSS). The development of FSS in mm-wave frequency range can be simplified by the knowledge of the sensitivity of their main characteristics as a function of the considered physical parameters. The FSS structure considered in this section is the square split ring resonator with copper strip lines backed by Roger 4003 C dielectric substrate. The FSS structure is simulated by using CST Microwave Studio transient solver. The resonance frequency and the bandwidth sensitivities as function structural parameters of FSS are obtained by using the simulation data. In this analysis, normal incident TE modes are considered.

Citation Download Citation

S. Islam, J. Stiens, and R. Vounckx "A sensitivity analysis of frequency selective surface based metamaterial at THz frequency", Proc. SPIE 7711, Metamaterials V, 77110L (29 April 2010); https://doi.org/10.1117/12.854062

ACCESS THE FULL ARTICLE

INSTITUTIONAL
Select your institution to access the SPIE Digital Library.

SELECT YOUR INSTITUTION

PERSONAL
Sign in with your SPIE account to access your personal subscriptions or to use specific features such as save to my library, sign up for alerts, save searches, etc.

PERSONAL SIGN IN

No SPIE Account? Create one

PURCHASE THIS CONTENT

SUBSCRIBE TO DIGITAL LIBRARY

50 downloads per 1-year subscription

Members: $195

Non-members: $335 ADD TO CART

25 downloads per 1 - year subscription

Members: $145

Non-members: $250 ADD TO CART

PURCHASE SINGLE ARTICLE

Includes PDF, HTML & Video, when available