Multiresolution analysis of 2D confocal microscope images

D. Bianchi; A. Vernes; G. Vorlaufer; G. Betz

doi:10.1117/12.854498

14 May 2010 Multiresolution analysis of 2D confocal microscope images

D. Bianchi, A. Vernes, G. Vorlaufer, G. Betz

Proceedings Volume 7718, Optical Micro- and Nanometrology III; 77180I (2010) https://doi.org/10.1117/12.854498
Event: SPIE Photonics Europe, 2010, Brussels, Belgium

Abstract

The functionality of the lifting is exploited scheme to analyze several white light confocal images of tribological/ engineering surfaces in terms of their roughness, waviness and form. The roughness parameters obtained are then compared with those resulting from other standard filtering techniques, like Gaussian filtering. Based on the wavelet transform, an attempt will also be made to provide a robust parameter for surface characterization.

Citation Download Citation

D. Bianchi, A. Vernes, G. Vorlaufer, and G. Betz "Multiresolution analysis of 2D confocal microscope images", Proc. SPIE 7718, Optical Micro- and Nanometrology III, 77180I (14 May 2010); https://doi.org/10.1117/12.854498

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