Paper
3 June 2010 Advanced 3D metrology atomic force microscope with crosstalk eliminated
Yueming Hua, Cynthia Coggins, Sung Park, Sang-il Park
Author Affiliations +
Proceedings Volume 7729, Scanning Microscopy 2010; 77290N (2010) https://doi.org/10.1117/12.853679
Event: Scanning Microscopy 2010, 2010, Monterey, California, United States
Abstract
The first generation AFM based on piezoelectric tube scanners has high spatial resolution and performs well in qualitative measurements. However, it suffers from poor repeatability and accuracy due to the background curvature and crosstalk between the x-y-z axes, making it inadequate for quantitative metrology. We developed a new AFM platform with a x-y flexure scanner, decoupled from the z scanner, which has a highly orthogonal and flat scan. The high speed z scanner with minimized drive mass provides a fast z servo response, making true non-contact AFM practical. The new AFM can also be used in critical angle measurements of microstructures such as reflective LCD display substrates. The design concept of the new AFM was utilized to measure under-cut structures by intentionally changing the angle of the z scanner, enabling the measurement and imaging of undercut structures as well as vertical sidewalls for the first time in AFM history.
© (2010) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Yueming Hua, Cynthia Coggins, Sung Park, and Sang-il Park "Advanced 3D metrology atomic force microscope with crosstalk eliminated", Proc. SPIE 7729, Scanning Microscopy 2010, 77290N (3 June 2010); https://doi.org/10.1117/12.853679
Advertisement
Advertisement
RIGHTS & PERMISSIONS
Get copyright permission  Get copyright permission on Copyright Marketplace
KEYWORDS
Atomic force microscopy

Scanners

3D metrology

3D image processing

Metrology

Atomic force microscope

3D scanning

Back to Top