Paper
3 June 2010 Dielectric slot tip for scanning near-field microwave microscope
Patrick Leidenberger, Christian Hafner
Author Affiliations +
Proceedings Volume 7729, Scanning Microscopy 2010; 77291K (2010) https://doi.org/10.1117/12.853727
Event: Scanning Microscopy 2010, 2010, Monterey, California, United States
Abstract
While tapered and coated fibers are used as probes for scanning near-field optical microscopy SNOM), tapered coaxial probes and other structures are used in the microwave regime for broad band measurements. Aperture probes, tapered fibers and tapered waveguides have the inherent disadvantage that the radiation will have to pass a cutoff region. This is not the case for coaxial probes and for appropriately chosen transmission lines based on metallic wires. To enhance the energy transition for a tapered SNOM tip, the cladding can be split by milling longitudinal slits in it. We demonstrate the principle of mode conversion in the microwave region, building a tip for a scanning near-field microwave microscope SNMM) with a feed similar to a SNOM tip with the slits in the cladding. Transition to a single wire mode is made at the very end of the tip. With this new kind of SNMM tip we scan a test structure and demonstrate a resolution of 1/882 wavelengths for double passage operation.
© (2010) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Patrick Leidenberger and Christian Hafner "Dielectric slot tip for scanning near-field microwave microscope", Proc. SPIE 7729, Scanning Microscopy 2010, 77291K (3 June 2010); https://doi.org/10.1117/12.853727
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KEYWORDS
Near field scanning optical microscopy

Copper

Microwave radiation

Waveguides

Cladding

Microscopes

Optical fibers

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