Characteristics of the depth of focus in a high-NA optical system with a SIAX for data storage

Jaisoon Kim; Moonseok Kim; Sukjoon Hong; Tom D. Milster

doi:10.1117/12.859234

3 June 2010 Characteristics of the depth of focus in a high-NA optical system with a SIAX for data storage

Jaisoon Kim, Moonseok Kim, Sukjoon Hong, Tom D. Milster

Proceedings Volume 7730, Optical Data Storage 2010; 77300M (2010) https://doi.org/10.1117/12.859234
Event: Optical Data Storage 2010, 2010, Boulder, Colorado, United States

Abstract

We study the tolerance characteristic of SIAX and suggest a newly designed SIL-Axicon system for the better tolerances. Methods for checking beam quality, optimization and remaining problems are suggested. SIL-Axicon system shows more tolerances in the uniformity of beam incident angle. Bessel beam (BB) with SIL can be used for multi layer high density data storage systems. We study the tolerance characteristic of SIAX and suggest a newly designed SIL-Axicon system for the better tolerances.

Citation Download Citation

Jaisoon Kim, Moonseok Kim, Sukjoon Hong, and Tom D. Milster "Characteristics of the depth of focus in a high-NA optical system with a SIAX for data storage", Proc. SPIE 7730, Optical Data Storage 2010, 77300M (3 June 2010); https://doi.org/10.1117/12.859234

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