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30 July 2010 Broadband soft x-ray polarimetry
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Abstract
We developed an instrument design capable of measuring linear X-ray polarization over a broad-band using conventional spectroscopic optics, using a method previously described by Marshall (2008) involving laterally graded, multilayer-coated flat mirrors. We present possible science investigations with such an instrument and two possible configurations. This instrument could be used in a small orbiting mission or scaled up for the International X-ray Observatory. Laboratory work has begun that would demonstrate the capabilities of key components.
© (2010) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Herman L. Marshall, Ralf K. Heilmann, Norbert S. Schulz, and Kendrah D. Murphy "Broadband soft x-ray polarimetry", Proc. SPIE 7732, Space Telescopes and Instrumentation 2010: Ultraviolet to Gamma Ray, 77320F (30 July 2010); https://doi.org/10.1117/12.857443
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