Paper
19 May 2010 Pupil masks for 2-D intensity synthesis in a high numerical aperture focusing system
Author Affiliations +
Proceedings Volume 7743, Southeast Asian International Advances in Micro/Nanotechnology; 77430N (2010) https://doi.org/10.1117/12.863847
Event: Southeast Asian International Advances in Micro/Nano-technology, 2010, Bangkok, Thailand
Abstract
A high numerical aperture (NA) lens is used in many applications that require tightly focused beams including microscopy. The Debye-Wolf electromagnetic diffraction integral describes focusing by high NA lenses. Using an eigenfunction expansion of this integral, we numerically obtain a pupil mask that generates an arbitrary, within the diffraction limit, intensity distribution at the Gaussian focal plane.
© (2010) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Leelada Rattanavija, Sherif S. Sherif, and Waleed S. Mohammed "Pupil masks for 2-D intensity synthesis in a high numerical aperture focusing system", Proc. SPIE 7743, Southeast Asian International Advances in Micro/Nanotechnology, 77430N (19 May 2010); https://doi.org/10.1117/12.863847
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KEYWORDS
Diffraction

Electromagnetism

Apodization

Microscopy

Polarization

Image quality

Bessel functions

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