Paper
10 September 2010 A comprehensive study of the contributions to the nonlinear optical properties of thin Ag films
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Abstract
We report on the nonlinear optical (NLO) transmittance and reflectance of a 20 nm-thick Ag film characterized by time-resolved white-light continuum pump-probe experiments. The change in complex permittivity Δε(t) is extracted and is fitted to the Drude model in the frequency domain and a two-temperature model in the time domain. A unified model is presented that fully describes the dynamic NLO response of a thin Ag film that can be incorporated easily into the modeling of more complex metal-dielectric multilayer structures designed to take advantage of the NLO response of Ag.
© (2010) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Daniel Owens, Canek Fuentes-Hernandez, Joel M. Hales, Joseph W. Perry, and Bernard Kippelen "A comprehensive study of the contributions to the nonlinear optical properties of thin Ag films", Proc. SPIE 7756, Active Photonic Materials III, 77560K (10 September 2010); https://doi.org/10.1117/12.860930
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KEYWORDS
Silver

Nonlinear optics

Reflectivity

Transmittance

Temperature metrology

Thallium

Thin films

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