Evaluation of semiconducting/metallic ratio of single wall carbon nanotubes by resonant Raman scattering

Kyoung In Min; Ki Kang Kim; Myoung-Kyu Oh; Soo Bong Choi; Heesuk Rho; Ha Jin Lee; Kay Hyeok An; Young Chul Choi; Jong Hun Han; Kyung Hui Oh; Young-Hee Lee; Mun Seok Jeong

doi:10.1117/12.861088

19 August 2010 Evaluation of semiconducting/metallic ratio of single wall carbon nanotubes by resonant Raman scatterings-excel

Kyoung In Min, Ki Kang Kim, Myoung-Kyu Oh, Soo Bong Choi, Heesuk Rho, Ha Jin Lee, Kay Hyeok An, Young Chul Choi, Jong Hun Han, Kyung Hui Oh, Young-Hee Lee, Mun Seok Jeong

Author Affiliations +

Proceedings Volume 7761, Carbon Nanotubes, Graphene, and Associated Devices III; 776103 (2010) https://doi.org/10.1117/12.861088
Event: SPIE NanoScience + Engineering, 2010, San Diego, California, United States

Abstract

We investigated single wall carbon nanotubes (SWCNTs) synthesized by the HiPCO method and further processed with nitronium hexafluoroantimonate (NO₂SbF₆ : NHFA) treatment using continuous resonant Raman scattering in the range of 570-900 nm. According to the population ratio calculation results from Raman scattering data, it is obvious that semiconducting SWCNTs with small diameter and metallic SWCNTs were selectively removed by NHFA.

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Kyoung In Min, Ki Kang Kim, Myoung-Kyu Oh, Soo Bong Choi, Heesuk Rho, Ha Jin Lee, Kay Hyeok An, Young Chul Choi, Jong Hun Han, Kyung Hui Oh, Young-Hee Lee, and Mun Seok Jeong "Evaluation of semiconducting/metallic ratio of single wall carbon nanotubes by resonant Raman scatterings-excel", Proc. SPIE 7761, Carbon Nanotubes, Graphene, and Associated Devices III, 776103 (19 August 2010); https://doi.org/10.1117/12.861088

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