Survey of interferometric techniques used to test JWST optical components

H. Philip Stahl; Chris Alongi; Andrea Arneson; Rob Bernier; Bob Brown; Dave Chaney; Glen Cole; Jay Daniel; Lee Dettmann; Ron Eng; Ben Gallagher; Robert Garfield; James Hadaway; Patrick Johnson; Allen Lee; Doug Leviton; Adam Magruder; Michael Messerly; Ankit Patel; Pat Reardon; John Schwenker; Martin Seilonen; Koby Smith; W. Scott Smith

doi:10.1117/12.862234

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2 August 2010 Survey of interferometric techniques used to test JWST optical components

H. Philip Stahl, Chris Alongi, Andrea Arneson, Rob Bernier, Bob Brown, Dave Chaney, Glen Cole, Jay Daniel, Lee Dettmann, Ron Eng, Ben Gallagher, Robert Garfield, James Hadaway, Patrick Johnson, Allen Lee, Doug Leviton, Adam Magruder, Michael Messerly, Ankit Patel, Pat Reardon, John Schwenker, Martin Seilonen, Koby Smith, W. Scott Smith

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Proceedings Volume 7790, Interferometry XV: Techniques and Analysis; 779002 (2010) https://doi.org/10.1117/12.862234
Event: SPIE Optical Engineering + Applications, 2010, San Diego, California, United States

Abstract

JWST optical component in-process optical testing and cryogenic requirement compliance certification, verification & validation is probably the most difficult metrology job of our generation in astronomical optics. But, the challenge has been met: by the hard work of dozens of optical metrologists; the development and qualification of multiple custom test setups; and several new inventions, including 4D PhaseCam and Leica Absolute Distance Meter. This paper summarizes the metrology tools, test setups and processes used to characterize the JWST optical components.

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H. Philip Stahl, Chris Alongi, Andrea Arneson, Rob Bernier, Bob Brown, Dave Chaney, Glen Cole, Jay Daniel, Lee Dettmann, Ron Eng, Ben Gallagher, Robert Garfield, James Hadaway, Patrick Johnson, Allen Lee, Doug Leviton, Adam Magruder, Michael Messerly, Ankit Patel, Pat Reardon, John Schwenker, Martin Seilonen, Koby Smith, and W. Scott Smith "Survey of interferometric techniques used to test JWST optical components", Proc. SPIE 7790, Interferometry XV: Techniques and Analysis, 779002 (2 August 2010); https://doi.org/10.1117/12.862234

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