Paper
2 August 2010 Simultaneous measurement of spectral reflectivity and birefringence of a stone surface using polarization phase-shifting interferometer
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Abstract
We aim to develop a method for distinguishing quality of stone artifacts. A value of stone artifacts depends on the polishing quality of the surface. However, it is difficult to evaluate quantitatively and its evaluation is performed by sensibility of experts. According to a theory, experts can sense a minute difference of optical characteristic of polished stone surface. We propose a simultaneous measurement of spectral reflectivity and birefringence of polished stone surface using the polarization phase-shifting interferometer. In the polarization phase-shifting interferometry, the phase-shifter gives a phase difference between perpendicular polarized beams. This phase difference can be considered the optical retardation. When the linearly polarized beam passes though a sample which has birefringence, the initial phase of interferogram is shifted. Thus, retardations in each wavelength can be calculated by Fourier analyzing a interferogram. First, we constructed a coaxial illumination type optical system for verification experiments. As a result, we confirmed the reflected light from surface is stronger than light from inner. Therefore, it cannot measure inner reflected light which has valuable optical characteristics. Based on these results, we improved the illumination method of optical system to oblique illumination. Finally, we can obtain the 2-dimentional spectral reflectivity and birefringence characteristics.
© (2010) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
H. Kobayashi and I. Ishimaru "Simultaneous measurement of spectral reflectivity and birefringence of a stone surface using polarization phase-shifting interferometer", Proc. SPIE 7790, Interferometry XV: Techniques and Analysis, 77900Y (2 August 2010); https://doi.org/10.1117/12.862267
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KEYWORDS
Polarization

Birefringence

Reflectivity

Interferometers

Phase shifts

Surface finishing

Mirrors

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