Paper
2 August 2010 Determination of refractive index of transparent plate by Fabry-Perot fringe analysis
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Abstract
We developed a simple and accurate method for measuring the refractive indices of transparent plates by analyzing the transmitted fringe pattern as a function of angle of incidence. By using two different wavelengths, we resolved the 2π- ambiguity inherent to the phase measurement involving a thick medium, leading to independent determination of the absolute index of refraction and the thickness with a relative uncertainty smaller than 10-5 for a 1 mm-thick fused silica plate. The accuracy of our method was confirmed with a standard reference material.
© (2010) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Hee Joo Choi, Hwan Hong Lim, Han Seb Moon, Tae Bong Eom, Jung J. Ju, and Myoungsik Cha "Determination of refractive index of transparent plate by Fabry-Perot fringe analysis", Proc. SPIE 7790, Interferometry XV: Techniques and Analysis, 77900Z (2 August 2010); https://doi.org/10.1117/12.862363
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CITATIONS
Cited by 2 scholarly publications.
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KEYWORDS
Refractive index

Fringe analysis

Refraction

Fabry–Perot interferometers

Interferometry

Helium neon lasers

Silica

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