Neutron detection with Gd/CdTe semiconductor detector

Aki Miyake; Takahiro Nishioka; Shailendra Singh; Hisashi Morii; Yoichiro Neo; Hidenori Mimura; Toru Aoki

doi:10.1117/12.862505

27 August 2010 Neutron detection with Gd/CdTe semiconductor detector

Aki Miyake, Takahiro Nishioka, Shailendra Singh, Hisashi Morii, Yoichiro Neo, Hidenori Mimura, Toru Aoki

Proceedings Volume 7805, Hard X-Ray, Gamma-Ray, and Neutron Detector Physics XII; 78051L (2010) https://doi.org/10.1117/12.862505
Event: SPIE Optical Engineering + Applications, 2010, San Diego, California, United States

Abstract

Cadmium telluride (CdTe) detector has been used to detect thermal neutrons; along with gadolinium (Gd) used as a neutron converter. Simulation results show that the appropriate thickness of Gd film for CdTe detector is 25 μm. The Gd/CdTe detector shows the 80 keV, 89 keV and 182 keV gamma ray emission peaks from ¹⁵⁵Gd(n, γ)¹⁵⁶Gd and ¹⁵⁷Gd(n, γ)¹⁵⁸Gd reactions.

Citation Download Citation

Aki Miyake, Takahiro Nishioka, Shailendra Singh, Hisashi Morii, Yoichiro Neo, Hidenori Mimura, and Toru Aoki "Neutron detection with Gd/CdTe semiconductor detector", Proc. SPIE 7805, Hard X-Ray, Gamma-Ray, and Neutron Detector Physics XII, 78051L (27 August 2010); https://doi.org/10.1117/12.862505

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