Noise Analysis And Performance Of A Selfscanned Linear Insb Detector Array

G. Finger; M. Meyer; A. F.M. Moorwood

doi:10.1117/12.940567

24 September 1987 Noise Analysis And Performance Of A Selfscanned Linear Insb Detector Array

G. Finger, M. Meyer, A. F.M. Moorwood

Proceedings Volume 0782, Infrared Sensors and Sensor Fusion; (1987) https://doi.org/10.1117/12.940567
Event: 1987 Technical Symposium Southeast on Optics, Electro-Optics, and Sensors, 1987, Orlando, FL, United States

Abstract

A noise model for detectors operated in the capacitive discharge mode is presented. It is used to analyse the noise performance of the ESO nested timing readout technique applied to a linear 32 element InSb array which is multiplexed by a silicon switched-FET shift register. Analysis shows that KTC noise of the videoline is the major noise contribution. It can be eliminated by weighted double correlated sampling. Best noise performance of this array is achieved at the smallest possible reverse bias voltage (< 20mV) whereas excess noise is observed at higher reverse bias voltages.

Citation Download Citation

G. Finger, M. Meyer, and A. F.M. Moorwood "Noise Analysis And Performance Of A Selfscanned Linear Insb Detector Array", Proc. SPIE 0782, Infrared Sensors and Sensor Fusion, (24 September 1987); https://doi.org/10.1117/12.940567

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