Characteristic analysis of IR signatures for different optical surface properties by computer modeling and field measurement

Jun-Hyuk Choi; Tae-Kuk Kim

doi:10.1117/12.865338

23 October 2010 Characteristic analysis of IR signatures for different optical surface properties by computer modeling and field measurement

Jun-Hyuk Choi, Tae-Kuk Kim

Author Affiliations +

Proceedings Volume 7830, Image and Signal Processing for Remote Sensing XVI; 78301L (2010) https://doi.org/10.1117/12.865338
Event: SPIE Remote Sensing, 2010, Toulouse, France

Abstract

This paper is a part of developing a program that generates IR images by considering the surface emitted radiance from objects. The spectral radiance received by a remote sensor is consisted of the self-emitted component directly from the target surface, the reflected component of the solar irradiance at the target surface, and the scattered component by the atmosphere without ever reaching the object surface. The radiance self-emitted from a surface can be calculated by using the temperature and optical property of the surface together with the spectral atmospheric transmittance. The thermal modeling is essential for identifying objects on the scenes obtained from the satellites. And the temperature distribution on the object is necessary to obtain their infrared images in contrast to the background. We considered the composite heat transfer modes including conduction, convection and spectral solar radiation for objects within a scene to calculate the surface temperature distribution. The object considered is assumed to be consisted of several different materials with different properties, such as conductivity, absorption, density, and specific heat etc. We get the weather conditions (air temperatures, wind directions, wind velocity, relative humidity and atmospheric pressure), solar irradiance and surface temperatures of the test plates. The measured diurnal emitted radiance from the test plate with several different surface properties are fairly well compared with the modeled results obtained from the software developed in this study.

Citation Download Citation

Jun-Hyuk Choi and Tae-Kuk Kim "Characteristic analysis of IR signatures for different optical surface properties by computer modeling and field measurement", Proc. SPIE 7830, Image and Signal Processing for Remote Sensing XVI, 78301L (23 October 2010); https://doi.org/10.1117/12.865338

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