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3 November 2010 High-resolution Crop Surface Models (CSM) and Crop Volume Models (CVM) on field level by terrestrial laser scanning
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Abstract
The interdisciplinary Transregional Collaborative Research Center 32 (CRC/TR 32) works on exchange processes between soil, vegetation, and the adjacent atmospheric boundary layer (SVA). Within this research project a terrestrial laser scanning sensor is used in a multitemporal approach for determining agricultural plant parameters. In contrast to other studies with phase-change or optical probe sensors, time-of-flight measurements are used. On three dates in the year 2008 a sugar beet field (4.3 ha) in Western Germany was surveyed by a terrestrial laser scanner (Riegl LMS-Z420i). Point clouds are georeferenced, trimmed, and compared with official elevation data. The estimated plant parameters are (i) surface model comparison between different crop surfaces and (ii) crop volumes as well as (iii) soil roughness parameters for SVA-Modelling. The results show, that the estimation of these parameters is possible and the method should be validated and extended.
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Dirk Hoffmeister, Andreas Bolten, Constanze Curdt, Guido Waldhoff, and Georg Bareth "High-resolution Crop Surface Models (CSM) and Crop Volume Models (CVM) on field level by terrestrial laser scanning", Proc. SPIE 7840, Sixth International Symposium on Digital Earth: Models, Algorithms, and Virtual Reality, 78400E (3 November 2010); https://doi.org/10.1117/12.872315
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