Demonstrations of beam quality of semiconductor lasers

Changqing Cao; Xiaodong Zeng; Yuying An

doi:10.1117/12.864421

12 November 2010 Demonstrations of beam quality of semiconductor lasers

Changqing Cao, Xiaodong Zeng, Yuying An

Proceedings Volume 7844, Semiconductor Lasers and Applications IV; 78441C (2010) https://doi.org/10.1117/12.864421
Event: Photonics Asia 2010, 2010, Beijing, China

Abstract

Based on the beam characteristics of semiconductor lasers, a new parameter for evaluating beam quality of semiconductor lasers is introduced. The shortcomings of M2 factor used in evaluating beam quality of semiconductor lasers are discussed and its limitations are pointed out. Moreover, some important aspects of the beam quality factor are discussed. The main factors to influence collimating the beam of semiconductor lasers are analyzed. Our results give us grounds to make the following conclusions: the new propagation parameter succeeds in its universality and adaptability.

Citation Download Citation

Changqing Cao, Xiaodong Zeng, and Yuying An "Demonstrations of beam quality of semiconductor lasers", Proc. SPIE 7844, Semiconductor Lasers and Applications IV, 78441C (12 November 2010); https://doi.org/10.1117/12.864421

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