A sub-aperture scanning method for detecting wavefront of long-focus lens

Yao Li; Jing Wang; Changlun Hou; Jian Bai

doi:10.1117/12.870537

9 November 2010 A sub-aperture scanning method for detecting wavefront of long-focus lens

Yao Li, Jing Wang, Changlun Hou, Jian Bai

Proceedings Volume 7849, Optical Design and Testing IV; 78492P (2010) https://doi.org/10.1117/12.870537
Event: Photonics Asia 2010, 2010, Beijing, China

Abstract

To detect the wavefront of a long-focus lens, a new method is proposed in this paper. It is based on two dimensional sub-aperture scanning and model method reconstruction. The number of stripes moved from one sub-aperture to another has a relationship with the wavefront slope. In most cases it can be approached to linear relation. Through scanning the initial wavefront slope data are achieved. Then with the slope data, the wavefront is reconstructed by model method with Zernike polynomials. Singular value decomposition method is used in the process of solving the matrix equation. Stripe-counting is one of the most important contents, which plays a decisive role in getting an accurate experimental result. The method's precision is validated after comparing it with laser interferometer. It also works in some situations that interferometer will not be suitable to detect a long-focus and large-diameter lens.

Citation Download Citation

Yao Li, Jing Wang, Changlun Hou, and Jian Bai "A sub-aperture scanning method for detecting wavefront of long-focus lens", Proc. SPIE 7849, Optical Design and Testing IV, 78492P (9 November 2010); https://doi.org/10.1117/12.870537

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