Phase shift based measurements using a pocket LCD projector

Yana Williams; Kevin Harding

doi:10.1117/12.871214

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11 November 2010 Phase shift based measurements using a pocket LCD projector

Yana Williams, Kevin Harding

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Proceedings Volume 7855, Optical Metrology and Inspection for Industrial Applications; 78550E (2010) https://doi.org/10.1117/12.871214
Event: Photonics Asia 2010, 2010, Beijing, China

Abstract

Phase shifting based measurements have been well established for use in both interferometry and structured light based measurements. The use of modern LCD, DLP or LCOS based projectors to create and shift projected patterns for use in phase shifting systems has provided new capabilities such as pattern masking, adjustable resolutions and active preprocessing, along with many challenges. Now the latest consumer projection technology has made available low cost, pocket-sized projectors, some with built in memory. These small projectors open up the possibility of mini-phase shift systems, as well as the possibility of portable measurement systems. This paper explores some of the possibilities for systems made with pocket size pattern projectors, and what some of the limitations may be that will need to be overcome. Experimental data will be presented that illustrates some of these challenges.

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Yana Williams and Kevin Harding "Phase shift based measurements using a pocket LCD projector", Proc. SPIE 7855, Optical Metrology and Inspection for Industrial Applications, 78550E (11 November 2010); https://doi.org/10.1117/12.871214

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