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11 November 2010Phase shift based measurements using a pocket LCD projector
Phase shifting based measurements have been well established for use in both interferometry and structured light based
measurements. The use of modern LCD, DLP or LCOS based projectors to create and shift projected patterns for use in
phase shifting systems has provided new capabilities such as pattern masking, adjustable resolutions and active
preprocessing, along with many challenges. Now the latest consumer projection technology has made available low
cost, pocket-sized projectors, some with built in memory. These small projectors open up the possibility of mini-phase
shift systems, as well as the possibility of portable measurement systems. This paper explores some of the possibilities
for systems made with pocket size pattern projectors, and what some of the limitations may be that will need to be
overcome. Experimental data will be presented that illustrates some of these challenges.
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Yana Williams, Kevin Harding, "Phase shift based measurements using a pocket LCD projector," Proc. SPIE 7855, Optical Metrology and Inspection for Industrial Applications, 78550E (11 November 2010); https://doi.org/10.1117/12.871214