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11 November 2010 Phase shift based measurements using a pocket LCD projector
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Phase shifting based measurements have been well established for use in both interferometry and structured light based measurements. The use of modern LCD, DLP or LCOS based projectors to create and shift projected patterns for use in phase shifting systems has provided new capabilities such as pattern masking, adjustable resolutions and active preprocessing, along with many challenges. Now the latest consumer projection technology has made available low cost, pocket-sized projectors, some with built in memory. These small projectors open up the possibility of mini-phase shift systems, as well as the possibility of portable measurement systems. This paper explores some of the possibilities for systems made with pocket size pattern projectors, and what some of the limitations may be that will need to be overcome. Experimental data will be presented that illustrates some of these challenges.
© (2010) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Yana Williams and Kevin Harding "Phase shift based measurements using a pocket LCD projector", Proc. SPIE 7855, Optical Metrology and Inspection for Industrial Applications, 78550E (11 November 2010);

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