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24 January 2011 Software framework for nano- and microscale measurement applications
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Proceedings Volume 7878, Intelligent Robots and Computer Vision XXVIII: Algorithms and Techniques; 787802 (2011) https://doi.org/10.1117/12.876575
Event: IS&T/SPIE Electronic Imaging, 2011, San Francisco Airport, California, United States
Abstract
Development of new instruments and measurement methods has advanced research in the field of nanotechnology. Development of measurement systems used in research requires support from reconfigurable software. Application frameworks can be used to develop domain-specific application skeletons. New applications are specialized from the framework by filling its extension points. This paper presents an application framework for nano- and micro-scale applications. The framework consists of implementation of a robotic control architecture and components that implement features available in measurement applications. To ease the development of user interfaces for measurement systems, the framework also contains ready-to-use user interface components. The goal of the framework was to ease the development of new applications for measurement systems. Features of the implemented framework were examined through two test cases. Benefits gained by using the framework were analyzed by determining work needed to specialize new applications from the framework. Also the degree of reusability of specialized applications was examined. The work shows that the developed framework can be used to implement software for measurement systems and that the major part of the software can be implemented by using reusable components of the framework. When developing new software, a developer only needs to develop components related to the hardware used and performing the measurement task. Using the framework developing new software takes less time. The framework also unifies structure of developed software.
© (2011) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Juha Röning, Ville Tuhkanen, Risto Sipola, and Tero Vallius "Software framework for nano- and microscale measurement applications", Proc. SPIE 7878, Intelligent Robots and Computer Vision XXVIII: Algorithms and Techniques, 787802 (24 January 2011); https://doi.org/10.1117/12.876575
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