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18 February 2011 Enhanced high-speed coherent diffraction imaging
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Proceedings Volume 7913, Laser Resonators and Beam Control XIII; 791307 (2011)
Event: SPIE LASE, 2011, San Francisco, California, United States
Due to recent advances in X-ray microscopy, we are now able to image objects with nanometer resolution thanks to Synchrotron beam lines or Free Electron Lasers (FEL). The PCI (Phase Contrast Imaging) is a robust technique that can recover the wavefront from measurements of only few intensity pictures in the Fresnel diffraction region. With our fast straightforward calculus methods, we manage to provide the phase induced by a microscopic specimen in few seconds. We can therefore obtain high contrasted images from transparent materials at very small scales. To reach atomic resolution imaging and thus make a transition from the near to the far field, the Coherent Diffraction Imaging (CDI) technique finds its roots in the analysis of diffraction patterns to obtain the phase of the altered complex wave. Theoretical results about existence and uniqueness of this retrieved piece of information by both iterative and direct algorithms have already been released. However, performances of algorithms remain limited by the coherence of the X-ray beam, presence of random noise and the saturation threshold of the detector. We will present reconstructions of samples using an enhanced version of HIO algorithm improving the speed of convergence and its repeatability. As a first step toward a practical X-Ray CDI system, initial images for reconstructions are acquired with the laser-based CDI system working in the visible spectrum.
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Jonathan Potier, Sebastien Fricker, and Mourad Idir "Enhanced high-speed coherent diffraction imaging", Proc. SPIE 7913, Laser Resonators and Beam Control XIII, 791307 (18 February 2011);

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