PROCEEDINGS VOLUME 7928
SPIE MOEMS-MEMS | 22-27 JANUARY 2011
Reliability, Packaging, Testing, and Characterization of MEMS/MOEMS and Nanodevices X
Editor Affiliations +
Proceedings Volume 7928 is from: Logo
SPIE MOEMS-MEMS
22-27 January 2011
San Francisco, California, United States
Front Matter: Volume 7928
Proceedings Volume Reliability, Packaging, Testing, and Characterization of MEMS/MOEMS and Nanodevices X, 792801 (2011) https://doi.org/10.1117/12.891640
Packaging and Integration Technologies of MOEMS/MEMS/NEMS I
Y. C. Lee
Proceedings Volume Reliability, Packaging, Testing, and Characterization of MEMS/MOEMS and Nanodevices X, 792802 (2011) https://doi.org/10.1117/12.877110
Muhannad S. Bakir, Paragkumar A. Thadesar, Calvin King, Jesal Zaveri, Hyung Suk Yang, Chaoqi Zhang, Yue Zhang
Proceedings Volume Reliability, Packaging, Testing, and Characterization of MEMS/MOEMS and Nanodevices X, 792803 (2011) https://doi.org/10.1117/12.876823
Minwoo Nam, Haekwan Oh, Geunyoung Kim, Hyunwoo Seo, Yotak Song, Sang Sik Yang, Kee-Keun Lee
Proceedings Volume Reliability, Packaging, Testing, and Characterization of MEMS/MOEMS and Nanodevices X, 792804 (2011) https://doi.org/10.1117/12.876092
Packaging and Integration Technologies of MOEMS/MEMS/NEMS II
Tolga Tekin, Ha-Duong Ngo, Olaf Wittler, Bouchaib Bouhlal, Klaus-Dieter Lang
Proceedings Volume Reliability, Packaging, Testing, and Characterization of MEMS/MOEMS and Nanodevices X, 792805 (2011) https://doi.org/10.1117/12.877099
N. Vodrahalli, C. Y. Li, V. Kosenko
Proceedings Volume Reliability, Packaging, Testing, and Characterization of MEMS/MOEMS and Nanodevices X, 792806 (2011) https://doi.org/10.1117/12.876877
Test Methodology and Reliability
Proceedings Volume Reliability, Packaging, Testing, and Characterization of MEMS/MOEMS and Nanodevices X, 792808 (2011) https://doi.org/10.1117/12.873164
V. Heikkinen, J. Aaltonen, B. Wälchli, H. Räikkönen, I. Kassamakov, T. Cholakova, K. Grigoras, S. Franssila, R. Kakanakov, et al.
Proceedings Volume Reliability, Packaging, Testing, and Characterization of MEMS/MOEMS and Nanodevices X, 792809 (2011) https://doi.org/10.1117/12.874966
Subramanian Sundaram, Maurizio Tormen, Branislav Timotijevic, Robert Lockhart, Ross P. Stanley, Herbert R. Shea
Proceedings Volume Reliability, Packaging, Testing, and Characterization of MEMS/MOEMS and Nanodevices X, 79280A (2011) https://doi.org/10.1117/12.873253
Alex Dommann, Antonia Neels
Proceedings Volume Reliability, Packaging, Testing, and Characterization of MEMS/MOEMS and Nanodevices X, 79280B (2011) https://doi.org/10.1117/12.876574
Steffen Kurth, Stefan Leidich, Andreas Bertz, Markus Nowack, Jörg Frömel, Christian Kaufmann, Wolfgang Faust, Thomas Gessner, Akira Akiba, et al.
Proceedings Volume Reliability, Packaging, Testing, and Characterization of MEMS/MOEMS and Nanodevices X, 79280C (2011) https://doi.org/10.1117/12.875424
Gilad Sharon, Donald Barker
Proceedings Volume Reliability, Packaging, Testing, and Characterization of MEMS/MOEMS and Nanodevices X, 79280D (2011) https://doi.org/10.1117/12.871536
Reliability of MEMS for Space Applications
Proceedings Volume Reliability, Packaging, Testing, and Characterization of MEMS/MOEMS and Nanodevices X, 79280E (2011) https://doi.org/10.1117/12.876968
Proceedings Volume Reliability, Packaging, Testing, and Characterization of MEMS/MOEMS and Nanodevices X, 79280F (2011) https://doi.org/10.1117/12.873466
Proceedings Volume Reliability, Packaging, Testing, and Characterization of MEMS/MOEMS and Nanodevices X, 79280G (2011) https://doi.org/10.1117/12.873546
Devices for Space Applications I
Tor-Arne Grönland, Maria Bendixen, Johan Bejhed, Håkan Johansson, Kerstin Jonsson, Pelle Rangsten
Proceedings Volume Reliability, Packaging, Testing, and Characterization of MEMS/MOEMS and Nanodevices X, 79280H (2011) https://doi.org/10.1117/12.876455
Proceedings Volume Reliability, Packaging, Testing, and Characterization of MEMS/MOEMS and Nanodevices X, 79280I (2011) https://doi.org/10.1117/12.874665
Tye Brady
Proceedings Volume Reliability, Packaging, Testing, and Characterization of MEMS/MOEMS and Nanodevices X, 79280J (2011) https://doi.org/10.1117/12.873909
Devices for Space Applications II: Joint Session with Conference 7930 and 7931
A. Scott, P. Bock, C. A. Ramos, B. Lamontagne, P. Cheben, M. Florjańczyk, I. M. Fernandez, S. Janz, A. Ortega-Monux, et al.
Proceedings Volume Reliability, Packaging, Testing, and Characterization of MEMS/MOEMS and Nanodevices X, 79280K (2011) https://doi.org/10.1117/12.877208
A. Prak, H. Leeuwis, R. G. Heideman, A. Leinse, G. Borst
Proceedings Volume Reliability, Packaging, Testing, and Characterization of MEMS/MOEMS and Nanodevices X, 79280L (2011) https://doi.org/10.1117/12.879309
Poster Session
Proceedings Volume Reliability, Packaging, Testing, and Characterization of MEMS/MOEMS and Nanodevices X, 79280N (2011) https://doi.org/10.1117/12.876069
Taehyeon Song, Minwoo Nam, SeungYeon Song, Hyun C. Yoon, Keekeun Lee
Proceedings Volume Reliability, Packaging, Testing, and Characterization of MEMS/MOEMS and Nanodevices X, 79280O (2011) https://doi.org/10.1117/12.876098
George Fercana, Gunther Kletetschka, Vilem Mikula, Mary Li
Proceedings Volume Reliability, Packaging, Testing, and Characterization of MEMS/MOEMS and Nanodevices X, 79280P (2011) https://doi.org/10.1117/12.878965
Joung-Man Park, Zuo-Jia Wang, Dong-Jun Kwon, Lawrence DeVries
Proceedings Volume Reliability, Packaging, Testing, and Characterization of MEMS/MOEMS and Nanodevices X, 79280Q (2011) https://doi.org/10.1117/12.871033
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