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22 April 1987 Characterization Of Optical And Transport Properties Of Semiconductors: A Photothermal Approach
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Proceedings Volume 0794, Modern Optical Characterization Techniques for Semiconductors and Semiconductor Devices; (1987) https://doi.org/10.1117/12.940885
Event: Advances in Semiconductors and Semiconductor Structures, 1987, Bay Point, FL, United States
Abstract
Photothermal spectroscopy employs the small rise in temperature associated with the absorption of electromagnetic radiation to probe optical and transport properties of materials. A review of the various photothermal detection schemes is given, and examples which illustrate the power of this technique are reviewed.
© (1987) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Nabil M. Amer "Characterization Of Optical And Transport Properties Of Semiconductors: A Photothermal Approach", Proc. SPIE 0794, Modern Optical Characterization Techniques for Semiconductors and Semiconductor Devices, (22 April 1987); https://doi.org/10.1117/12.940885
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