Defect mediated detection of wavelengths around 1550 nm in a ring resonant structure

A. P. Knights; J. K. Doylend; D. F. Logan; J. J. Ackert; P. E. Jessop; P. Velha; M. Sorel; R. M. De La Rue

doi:10.1117/12.874018

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17 January 2011 Defect mediated detection of wavelengths around 1550 nm in a ring resonant structure

A. P. Knights, J. K. Doylend, D. F. Logan, J. J. Ackert, P. E. Jessop, P. Velha, M. Sorel, R. M. De La Rue

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Proceedings Volume 7943, Silicon Photonics VI; 794308 (2011) https://doi.org/10.1117/12.874018
Event: SPIE OPTO, 2011, San Francisco, California, United States

Abstract

In this paper we outline recent results which combine defect mediated Photo-Detectors (PDs) in a Ring Resonator (RR) structure. By exploiting the multiple-pass of the optical signal through the detector, we are able to significantly decrease the size of the detector structure while maintaining good responsivity (typically 0.1 A/W). In such a geometry the detector bandwidth is not capacitance limited, while the leakage current is reduced toward 1 nA. We also show that these PDs may be used in the drop port of a RR to monitor the propagating signal. These devices have applicability in multiplexing and potential for integration with high speed modulation functionality.

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A. P. Knights, J. K. Doylend, D. F. Logan, J. J. Ackert, P. E. Jessop, P. Velha, M. Sorel, and R. M. De La Rue "Defect mediated detection of wavelengths around 1550 nm in a ring resonant structure", Proc. SPIE 7943, Silicon Photonics VI, 794308 (17 January 2011); https://doi.org/10.1117/12.874018

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