Paper
1 March 2011 Study of nanoprisms via apertureless near-field optical microscopy
Chak-Fong Cheang, Yi-Cheng Li, Kuo-Chih Chiu, Chun-Yu Lin, Yun-Chorng Chang, Shean-Jen Chen
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Abstract
To study nano-scale optical local-field phenomena, an apertureless near-field scanning optical microscope (aNSOM) is an important tool. Herein, an aNSOM has been developed and is utilized for observing the local surface plasmon resonance, wave propagation, and nano-antenna enhancement of nanoprisms. The developed aNSOM, based on a commercial atomic force microscope, is integrated with homodyne and heterodyne interferometric techniques to detect the near-field amplitude and phase of nanostructures. With the help of mechanical system designs, different illumination direction s and detections for different applications can be achieved.
© (2011) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Chak-Fong Cheang, Yi-Cheng Li, Kuo-Chih Chiu, Chun-Yu Lin, Yun-Chorng Chang, and Shean-Jen Chen "Study of nanoprisms via apertureless near-field optical microscopy", Proc. SPIE 7946, Photonic and Phononic Properties of Engineered Nanostructures, 79461M (1 March 2011); https://doi.org/10.1117/12.877151
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KEYWORDS
Near field

Near field optics

Near field scanning optical microscopy

Silver

Atomic force microscopy

Heterodyning

Surface roughness

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