Paper
20 April 1987 Measurement Of Band Discontinuities For The Double Heterojunction ZnSe:MnSe:ZnSe
H. Asonen, J. Lilja, A. Vuoristo, M. Ishiko, M. Pessa
Author Affiliations +
Proceedings Volume 0796, Growth of Compound Semiconductors; (1987) https://doi.org/10.1117/12.941004
Event: Advances in Semiconductors and Semiconductor Structures, 1987, Bay Point, FL, United States
Abstract
UV-photoemission spectroscopy was used to measure directly the valence-band discontinuity, ΔEv, for both sides of a MnSe layer which was sandwiched between two ZnSe layers by the Molecular Beam Epitaxy method. ΔEv is 0.16±0.05 eV for each interface; the valence band edge EVmax of the wider-gap MnSe semiconductor lies within the ZnSe gap. The interface-pinning position of the Fermi level appears at 1.74 eV above Evmax of ZnSe. It is concluded that interfacial electrostatic dipoles are small compared to the observed shift in Evmax of MnSe, which lends a qualitative support to Tersoff's model [Phys. Rev. Lett 52, 465 11984); Phys. Rev. B 30, 4874 (1984)] of heterojunction band offsets. Photoemission from MnSe shows that the Mn-derived 3d states, which are responsible for the semiconductor magneto-optical properties, lay 4.2 ± 0.1 eV below EVax.
© (1987) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
H. Asonen, J. Lilja, A. Vuoristo, M. Ishiko, and M. Pessa "Measurement Of Band Discontinuities For The Double Heterojunction ZnSe:MnSe:ZnSe", Proc. SPIE 0796, Growth of Compound Semiconductors, (20 April 1987); https://doi.org/10.1117/12.941004
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KEYWORDS
Heterojunctions

Interfaces

Semiconductors

Manganese

Zinc

Compound semiconductors

Magnetic semiconductors

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