Paper
4 April 2011 Decomposition-aware standard cell design flows to enable double-patterning technology
Lars Liebmann, David Pietromonaco, Matthew Graf
Author Affiliations +
Abstract
Maintaining the microelectronics industry's aggressive pace of density scaling beyond the resolution limits of optical lithography is forcing the introduction of double-patterning technology (DPT) that effectively doubles the pattern density achievable with 193nm optical lithography. This paper investigates the degree to which DPT affects design tools, layout methodologies, and data standards. Design solutions are demonstrated and the efficiency of various double-patterning aware design methodologies is compared based on the first metal level of a 20nm-node standard cell design flow. Necessary design-tool and data-standard requirements for a DPT-aware standard cell design flows are enumerated and summarized.
© (2011) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Lars Liebmann, David Pietromonaco, and Matthew Graf "Decomposition-aware standard cell design flows to enable double-patterning technology", Proc. SPIE 7974, Design for Manufacturability through Design-Process Integration V, 79740K (4 April 2011); https://doi.org/10.1117/12.879643
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CITATIONS
Cited by 35 scholarly publications and 6 patents.
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KEYWORDS
Standards development

Double patterning technology

Photomasks

Optical lithography

Picosecond phenomena

Image processing

Metals

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