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19 January 2011 Analysis of the stress-optical effects in silica-on-silicon optical waveguides
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Proceedings Volume 7986, Passive Components and Fiber-Based Devices VII; 798611 (2011) https://doi.org/10.1117/12.888431
Event: Asia Communications and Photonics Conference and Exhibition, 2010, Shanghai, Shanghai, China
Abstract
Stress-induced birefringence in silica-on-silicon waveguides is analyzed by the finite element method using the normalized plane strain model. The simulation results show that the thermal expansion coefficient of the upper-cladding is the most critical factor. A waveguide with zero birefringence is obtained and used to realize polarization independent AWGs.
© (2011) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Tingting Lang, Jingguo Kuang, and Xufeng Lin "Analysis of the stress-optical effects in silica-on-silicon optical waveguides", Proc. SPIE 7986, Passive Components and Fiber-Based Devices VII, 798611 (19 January 2011); https://doi.org/10.1117/12.888431
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