Paper
18 February 2011 Effect of CeO2 cap layers on the preparation of YBCO films on rolling-assisted biaxially textured substrates by pulsed laser deposition
Linfei Liu, Yijie Li, Huaran Liu, Xiaokun Song, Dan Hong, Ying Wang, Da Xu, Shengping Zhu
Author Affiliations +
Proceedings Volume 7995, Seventh International Conference on Thin Film Physics and Applications; 799527 (2011) https://doi.org/10.1117/12.888409
Event: Seventh International Conference on Thin Film Physics and Applications, 2010, Shanghai, China
Abstract
YBCO films were grown on CeO2/YSZ/CeO2 buffered rolling-assisted biaxially textured substrates (RABiTS) by pulsed lased deposition (PLD). CeO2 cap layer was deposited prior to YBCO growth. CeO2 cap layers of different thickness were prepared to evaluate the thickness dependence of the YBCO films. The microstructure and surface morphology of the films were examined by X-ray diffraction (XRD) and scanning electron microscopy (SEM). It is found that the thickness of the cap layer can remarkably affect the preparation of the subsequent YBCO layer. The possible mechanisms responsible for the dependence of the structure and the preparation of the YBCO films on the thickness of the CeO2 cap layers are discussed.
© (2011) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Linfei Liu, Yijie Li, Huaran Liu, Xiaokun Song, Dan Hong, Ying Wang, Da Xu, and Shengping Zhu "Effect of CeO2 cap layers on the preparation of YBCO films on rolling-assisted biaxially textured substrates by pulsed laser deposition", Proc. SPIE 7995, Seventh International Conference on Thin Film Physics and Applications, 799527 (18 February 2011); https://doi.org/10.1117/12.888409
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KEYWORDS
Scanning electron microscopy

Superconductors

X-ray diffraction

Pulsed laser deposition

Metals

Particles

Interfaces

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