Paper
26 July 2011 Structural and optical characterisation of planar waveguides obtained via Sol-Gel
F. Rey-García, C. Gómez-Reino, M. T. Flores-Arias, G. F. De La Fuente, W. Assenmacher, W. Mader
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Proceedings Volume 8001, International Conference on Applications of Optics and Photonics; 800116 (2011) https://doi.org/10.1117/12.891941
Event: International Conference on Applications of Optics and Photonics, 2011, Braga, Portugal
Abstract
Planar waveguides of SiO2:TiO2 (multilayer structure) and SiO2:CeO2 (thick layer) were prepared onto commercial glass substrates using a sol-gel technique combined with dip-coating. These glassy coatings were structural characterised by Transmission Electron Microscopy (TEM) Energy Dispersive X-ray analysis and by Confocal Microscopy. Thicknesses of 1230 nm and 4,15 μm and refractive indices of 1.59 and 1.48 for SiO2:TiO2 (70:30) and SiO2:CeO2 (95:5) waveguides were obtained, respectively, by Spectroscopic Ellypsometry. Losses of 0.8 dB/cm were measured by double prism method in the SiO2:CeO2 system.
© (2011) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
F. Rey-García, C. Gómez-Reino, M. T. Flores-Arias, G. F. De La Fuente, W. Assenmacher, and W. Mader "Structural and optical characterisation of planar waveguides obtained via Sol-Gel", Proc. SPIE 8001, International Conference on Applications of Optics and Photonics, 800116 (26 July 2011); https://doi.org/10.1117/12.891941
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KEYWORDS
Sol-gels

Planar waveguides

Prisms

Transmission electron microscopy

Waveguides

Glasses

Interfaces

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