Paper
8 July 2011 Discharge light and carbonization distribution characteristics at XLPE-silicon rubber interface with silicon-grease in tracking failure test
Liang Gu, W. Liu, S. L. Lei, S. B. Wang, Y. Y. Deng
Author Affiliations +
Proceedings Volume 8009, Third International Conference on Digital Image Processing (ICDIP 2011); 80091V (2011) https://doi.org/10.1117/12.896673
Event: 3rd International Conference on Digital Image Processing, 2011, Chengdu, China
Abstract
Imaging processing method was adopted to investigate the effect of silicon grease on tracking failure of the XLPEsilicon rubber interface by analyzing the distribution characteristics of discharge light and carbonization at the interface. Three interfaces were set up by pressing together a slice of XLPE and a slice of transparent silicon rubber. One filled silicon grease and the other partly filled the grease. As comparison, the third one filled on grease. High voltage (AC 50 Hz) was applied on a pair of flat-round electrodes sandwiched at the interface with their insulation distance of 5 mm. When the test voltage was raised to a certain value, discharge occurred and discharge light appeared and carbonization accumulated at the interface. The discharge light from discharge to the failure and the carbonization after the failure was recorded with a digital video recorder and then the images were analyzed with image processing method. Obtained results show that silicon grease at the interface weakens the transportation of charge and enhances the interfacial breakdown strength. However, interfacial discharge and tracking failure easily occur once discharge appears. Image processing method is helpful to understand the tracking failure process and mechanism of XLPE cable joint.
© (2011) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Liang Gu, W. Liu, S. L. Lei, S. B. Wang, and Y. Y. Deng "Discharge light and carbonization distribution characteristics at XLPE-silicon rubber interface with silicon-grease in tracking failure test", Proc. SPIE 8009, Third International Conference on Digital Image Processing (ICDIP 2011), 80091V (8 July 2011); https://doi.org/10.1117/12.896673
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KEYWORDS
Silicon

Interfaces

Electrodes

Failure analysis

Image processing

Silicon carbide

Fractal analysis

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