Stirling-cycle cooler reliability growth at L-3 CE

David Arndt; Dan Kuo; Quang Phan

doi:10.1117/12.884801

20 May 2011 Stirling-cycle cooler reliability growth at L-3 CE

David Arndt, Dan Kuo, Quang Phan

Proceedings Volume 8012, Infrared Technology and Applications XXXVII; 80122P (2011) https://doi.org/10.1117/12.884801
Event: SPIE Defense, Security, and Sensing, 2011, Orlando, Florida, United States

Abstract

L-3 CE has in place a continuous effort to evaluate and improve the lifetime of its cryocooler products. This effort includes analysis of both lab environment reliability tests and field data from shipped units. The purpose of this paper is to outline L-3 CE's life testing methodology and provide reliability data for L-3 CE cryocoolers, specifically for the 0.6- Watt Cooler (Model B602), 1.0-Watt Reduced Size, Weight, and Power (RSWAP) Cooler (Model B610), and the 1.5- Watt Cooler (Model B1500). Cooler performance characteristics such as cooldown time, refrigeration capacity, and input power are monitored throughout the life of the cooler. The data presented here updates previously reported data. Field data for the 1.0-Watt Cooler (Model B1000) is also presented.

Citation Download Citation

David Arndt, Dan Kuo, and Quang Phan "Stirling-cycle cooler reliability growth at L-3 CE", Proc. SPIE 8012, Infrared Technology and Applications XXXVII, 80122P (20 May 2011); https://doi.org/10.1117/12.884801

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