Infrared lock-in techniques for solar cell inspection

Ralph A. Rotolante; Bill Schneider

doi:10.1117/12.885953

10 May 2011 Infrared lock-in techniques for solar cell inspection

Ralph A. Rotolante, Bill Schneider

Proceedings Volume 8013, Thermosense: Thermal Infrared Applications XXXIII; 80130L (2011) https://doi.org/10.1117/12.885953
Event: SPIE Defense, Security, and Sensing, 2011, Orlando, Florida, United States

Abstract

Infrared active-source lock-in techniques are used for a variety of solar cell inspections, including electro- and photoluminescence, carrier density imaging, shunt imaging and physical defects. The principles and power of the lock-in technique are reviewed for these inspection methods. Different camera types, including NIR, MW and LW, are available for the different techniques. A selection of excitation sources--electrical, laser, lamp and mechanical-stimulate different physical phenomena. Measurements are presented of several manufacturing yield limiting parameters, and the advantages and limitations of the techniques are discussed.

Citation Download Citation

Ralph A. Rotolante and Bill Schneider "Infrared lock-in techniques for solar cell inspection", Proc. SPIE 8013, Thermosense: Thermal Infrared Applications XXXIII, 80130L (10 May 2011); https://doi.org/10.1117/12.885953

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