SR-5000N design: spectroradiometer's new performance improvements in FOV response uniformity (flatness) scan speed and other important features

Dario Cabib; Shmuel Shapira; Moshe Lavi; Amir Gil; Uri Milman

doi:10.1117/12.884197

9 May 2011 SR-5000N design: spectroradiometer's new performance improvements in FOV response uniformity (flatness) scan speed and other important features

Dario Cabib, Shmuel Shapira, Moshe Lavi, Amir Gil, Uri Milman

Author Affiliations +

Proceedings Volume 8014, Infrared Imaging Systems: Design, Analysis, Modeling, and Testing XXII; 801418 (2011) https://doi.org/10.1117/12.884197
Event: SPIE Defense, Security, and Sensing, 2011, Orlando, Florida, United States

Abstract

As far as we know, CI has been the only manufacturer in the world of commercial visible/infrared spectroradiometers for remote sensing applications for many years. In this paper we describe the new design and some performance improvements that we are developing to renew and modernize the system. Simultaneous visible and infrared spectroradiometry, field of view flatness of response and scan speed are only some aspects of the system which have undergone significant improvement. The challenge is to achieve these functional improvements without losing any of the advantages of the traditional system as far as ruggedness for field use, interchangeability of spectral range and field of view and aiming and image recording facility. Important factors in the success of this endeavor are: i) the development of a new electronic signal processing package, ii) a modular optical concept that mechanically separates modules for small, medium and large field of view ranges, and iii) a compact overall shape for convenience of use. Actual instrument performance results will be reported in a future paper.

Citation Download Citation

Dario Cabib, Shmuel Shapira, Moshe Lavi, Amir Gil, and Uri Milman "SR-5000N design: spectroradiometer's new performance improvements in FOV response uniformity (flatness) scan speed and other important features", Proc. SPIE 8014, Infrared Imaging Systems: Design, Analysis, Modeling, and Testing XXII, 801418 (9 May 2011); https://doi.org/10.1117/12.884197

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